RTX 2012HS DECT RF Test Platform

The RTX2012HS RF Test Platform for DECT/DECT 6.0/CAT-iq/Japan DECT supports a wide range of RF tests in connected mode. Its high-performance measurement capability makes it ideal for high-throughput manufacturing applications. Its extended measurement capabilities make it a perfect tool in the R&D environment as well. The tester can be setup as either a handset or a base station, with added test capabilities. Used in fixed part testing, the RTX2012HS acts as a handset and the Device Under Test (DUT) acts as a base station and vice versa.