Keysight N9080B LTE Advanced FDD Measurement Application

The LTE/LTE-Advanced FDD measurement application is one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements and software. Transforming the X-Series signal analyzers into standard-based transmitter testers, the application provides RF conformance measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced FDD base station and user equipment devices. The measurement application closely follows the 3GPP standard allowing you to stay on the leading edge of your design and manufacturing challenges. For LTE-Advanced demodulation measurements, such as EVM and frequency error, the measurement application offers two modes for acquisition of up to 5 carriers. The first mode offers simultaneous acquisition of up to 5 intra band contiguous/non-contiguous component carriers with a single wideband capture (requires PXA/MXA with 160 MHz bandwidth), or the second mode which uses an automatic sequencing function, eliminating the need for the wide analysis bandwidth option on the X-Series signal analyzer, thereby reducing the overall test equipment cost.